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X-Ray Photoelectron Spectroscopy: An Introduction to Principles and Practices [Hardcover]

Paul van der Heide

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Book Description

27 Jan 2012 1118062531 978-1118062531
This book introduces readers interested in the field of X–ray Photoelectron Spectroscopy (XPS) to the practical concepts in this field. The book first introduces the reader to the language and concepts used in this field and then demonstrates how these concepts are applied. Including how the spectra are produced, factors that can influence the spectra (all initial and final state effects are discussed), how to derive speciation, volume analysed and how one controls this (includes depth profiling), and quantification along with background substraction and curve fitting methodologies.   This is presented in a concise yet comprehensive manner and each section is prepared such that they can be read independently of each other, and all equations are presented using the most commonly used units. Greater emphasis has been placed on spectral understanding/interpretation. For completeness sake, a description of commonly used instrumentation is also presented. Finally, some complementary surface analytical techniques and associated concepts are reviewed for comparative purposes in stand–alone appendix sections.

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“The book is a useful resource for those interested in the field, and will probably be found to be of particular value by instrumentation support professionals and nonspecialists.”  ( Analytical and Bioanalytical Chemistry , 14 February 2013)   “It is an excellent text and although a competent physicist might already have grasped the principles explained in this book, the multitude of XPS users I come across (PhD chemists, engineers and pharmacists) will find this a breath of fresh air.”  (Chemistry World,  1 September 2012)                    

From the Back Cover

The essential reference on X–ray Photoelectron Spectroscopy (XPS) and its practical applications X–ray Photoelectron Spectroscopy represents the most heavily used of the electron spectroscopies for surface analysis. This book serves as a definitive introduction to this field by providing concise yet comprehensive coverage of all key concepts and then supplying relevant, illuminating examples of real–world applications. Placing an emphasis on spectral understanding and interpretation, the book includes coverage of topics including: how to interpret the different spectra revealed by XPS; how they are produced and factors that can influence the spectra (including initial and final state effects); as well as how to derive speciation, volume analyzed and how to control this (including depth profiling), along with background substraction and curve–fitting methodologies. With each section standing alone, the text can be read from front to back or treated as a comprehensive resource that researchers, developers, and technicians of all levels can access as needed. Including review questions to help readers measure their comprehension of the material, as well as a comparative review of some complementary surface analytical techniques and associated concepts, X–ray Photoelectron Spectroscopy is designed to enhance understanding of this rapidly growing field.

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Front Cover | Copyright | Table of Contents | Excerpt | Index
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