Matching Properties of Deep Sub-Micron MOS Transistors and over 1.5 million other books are available for Amazon Kindle . Learn more

Quantity:

More Buying Choices

Have one to sell? Sell yours here

Sorry, this item is not available in

Image not available for
Colour:

Image not available

Share your own customer images

Search inside this book

Start reading Matching Properties of Deep Sub-Micron MOS Transistors on your Kindle in under a minute.

Don't have a Kindle? Get your Kindle here, or download a FREE Kindle Reading App.

Matching Properties of Deep Sub-Micron MOS Transistors (The Springer International Series in Engineering and Computer Science) [Paperback]

Jeroen A. Croon (Author), Willy M Sansen (Author), Herman E. Maes (Author)

Price:	�126.00 & this item Delivered FREE in the UK with Super Saver Delivery. See details and conditions
Deal Price:
	o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o

In stock.
Dispatched from and sold by Amazon. Gift-wrap available.

Want delivery by Tuesday, 28 May? Choose Express delivery at checkout. See Details

Formats	Amazon Price	New from	Used from
Kindle Edition	�88.20	--	--
Hardcover	�144.00	--	--
Paperback	�126.00	--	--

Amazon.co.uk Trade-In Store
Did you know you can trade in your old books for an Amazon.co.uk Gift Card to spend on the things you want? Visit the Books Trade-In Store for more details. Learn more.

› See more product promotions

Book Description

Publication Date: 28 Oct 2010 | ISBN-10: 1441937188 | ISBN-13: 978-1441937186 | Edition: Softcover reprint of hardcover 1st ed. 2005

Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermore, due to the down-scaling of device dimensions, transistor mismatch has an increasing impact on digital circuits. The matching properties of MOSFETs are studied at several levels of abstraction: A simple and physics-based model is presented that accurately describes the mismatch in the drain current. The model is illustrated by dimensioning the unit current cell of a current-steering D/A converter. The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters. The physical origins of microscopic fluctuations and how they affect MOSFET operation are investigated. This leads to a refinement of the generally applied 1/area law. In addition, the analysis of simple transistor models highlights the physical mechanisms that dominate the fluctuations in the drain current and transconductance. The impact of process parameters on the matching properties is discussed. The impact of gate line-edge roughness is investigated, which is considered to be one of the roadblocks to the further down-scaling of the MOS transistor. Matching Properties of Deep Sub-Micron MOS Transistors is aimed at device physicists, characterization engineers, technology designers, circuit designers, or anybody else interested in the stochastic properties of the MOSFET.

#outer_postBodyPS { display: none; } #psGradient { display: none; } #psPlaceHolder { display: none; } #psExpand { display: none; } Matching Properties of Deep Sub-Micron MOS Transistors examines this interesting phenomenon. Microscopic fluctuations cause stochastic parameter fluctuations that affect the accuracy of the MOSFET. For analog circuits this determines the trade-off between speed, power, accuracy and yield. Furthermore, due to the down-scaling of device dimensions, transistor mismatch has an increasing impact on digital circuits. The matching properties of MOSFETs are studied at several levels of abstraction: A simple and physics-based model is presented that accurately describes the mismatch in the drain current. The model is illustrated by dimensioning the unit current cell of a current-steering D/A converter. The most commonly used methods to extract the matching properties of a technology are bench-marked with respect to model accuracy, measurement accuracy and speed, and physical contents of the extracted parameters. The physical origins of microscopic fluctuations and how they affect MOSFET operation are investigated. This leads to a refinement of the generally applied 1/area law. In addition, the analysis of simple transistor models highlights the physical mechanisms that dominate the fluctuations in the drain current and transconductance. The impact of process parameters on the matching properties is discussed. The impact of gate line-edge roughness is investigated, which is considered to be one of the roadblocks to the further down-scaling of the MOS transistor. Matching Properties of Deep Sub-Micron MOS Transistors is aimed at device physicists, characterization engineers, technology designers, circuit designers, or anybody else interested in the stochastic properties of the MOSFET.

Product details

Paperback: 208 pages
Publisher: Springer; Softcover reprint of hardcover 1st ed. 2005 edition (28 Oct 2010)
Language: English
ISBN-10: 1441937188
ISBN-13: 978-1441937186
Product Dimensions: 15.6 x 1.1 x 23.4 cm

Would you like to update product info or give feedback on images?

See Complete Table of Contents

More About the Author

› Visit Amazon's Jeroen A. Croon Page

Discover books, learn about writers, and more.

Inside This Book (Learn More)

Browse Sample Pages
Front Cover | Copyright | Table of Contents | Excerpt | Back Cover

Customer Reviews

There are no customer reviews yet on Amazon.co.uk.

5 star

4 star

3 star

2 star

1 star

There are no customer reviews yet.

Write a customer review

Most Helpful Customer Reviews on Amazon.com ^(beta)

Amazon.com: 5.0 out of 5 stars 1 review

3 of 6 people found the following review helpful

5.0 out of 5 stars Give me a 5 star rating... 23 Feb 2005

By The master cook - Published on Amazon.com

Format:Hardcover

...and next time you visit Eindhoven I'll prepare you a fabulous dinner! groetjes, Jeroen

› Go to Amazon.com to see the review 5.0 out of 5 stars

Was this review helpful? Let us know

.jsOffDisplayBlock { display: block; } .jsOffDisplayInline { display: inline; } .jsOffVisibility { visibility: visible; } .jsOnDisplayBlock { display: none; } .jsOnDisplayNoneBlock { display: block; } .jsOnDisplayNoneInline { display: inline; } .jsOnDisplayInline { display: none; } .jsOnVisibility { visibility: hidden; } .jqOnDisplayBlock { display: none; } .jqOnDisplayInline { display: none; } .jqOnVisibility { visibility: hidden; } .jqOnDisplayNoneBlock { display: block; } .jqOnDisplayNoneInline { display: inline; }

Customer Discussions

This product's forum

Discussion	Replies	Latest Post
No discussions yet

Ask questions, Share opinions, Gain insight

Start a new discussion

Topic:

First post:

Receive e-mail when new posts are made

Prompts for sign-in

Guidelines

Search Customer Discussions

Listmania!

Create a Listmania! list

Feedback

Would you like to update product info or give feedback on images?
I am the Author, and I want to comment on my book.
I am the Publisher, and I want to comment on this book.

Amazon.co.uk Privacy Statement

Amazon.co.uk Delivery Information

Amazon.co.uk Returns & Exchanges