The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
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From the reviews: “This book shows how optical microscopy can be used in the characterization and metrology of various surfaces. … Several important methods are presented in a clear and simple way … . The case studies scattered throughout the text greatly improve the readability and contribute to the practical emphasis of this book. … the index is comprehensive. I recommend this book to anyone trying to find the most appropriate method for surface topography measurement, as well as researchers who are new to using microscopy for measurements.” (Dejan Pantelić, Optics & Photonics News, December, 2011)
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The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manufacturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
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3 of 3 people found the following review helpful
Format:Hardcover
This edited collection is a very clear and systematic overview of techniques in a field of growing importance in engineering, technology and manufacturing. Professor Leach of the National Physical Laboratory (UK) has succeeded in bringing together some of the leading experts to cover topics such as Optical 3D Sensors, Chromatic Confocal Microscopy, Phase Shifting Interferometry, Digital Holographic Microscopy and Light Scattering Methods. The researcher and student will find the book to be state-of-the-art and facilitated by its ample use of graphic material including many useful colour images and extensive reference lists. Those who work in many fields - as diverse as fluidics, optics, tribology and aerodynamics - will want to have a copy on their shelf or in their library. Highly recommended.
Prof. G. Hunt, St Mary's University College, London.
Prof. G. Hunt, St Mary's University College, London.
1 of 1 people found the following review helpful
Format:Hardcover
Richard Leach who is an internationally recognised expert in surface topography has put together the contributions from many leading experts in the field to make this book an excellent comprehensive overview of all the optical measurement techniques. From my own experience I know that producing such a work requires not only thorough knowledge but also dedication and endurance. These techniques have become extremely important to designers and manufacturers of precison components and end-products at the micro-nanoscale where non-invasive measurements are essential. The book is well-structured and balanced to appeal to students, researchers and practitioners. The graphical material and extensive list of references are particularly useful. I recommend the book to all who wish to have a detailed knowledge of the fundamentals of optical measurement surface topography and the current techniques available.
1 of 1 people found the following review helpful
By Chris Jones
Format:Hardcover
Measurement of surface topography on the micro- to nanoscale with optical measurement techniques is essential to support all the technological advantages we take for granted: consumer electronics; bioengineering; energy; transport; defence and more.
This book contains a good balance of the relevant fundamentals and a thorough but practical description of the key optical techniques. It is ideally suited to teach a student or professional the power and limitations of the techniques.
Professor Leach is an internationally-respected independent expert in surface topography measurement at the UK government-funded National Physical Laboratory. He has edited this book from the contributions of the experts and manufacturers for each optical measurement technique.
As an expert in the field I would recommend this book.
This book contains a good balance of the relevant fundamentals and a thorough but practical description of the key optical techniques. It is ideally suited to teach a student or professional the power and limitations of the techniques.
Professor Leach is an internationally-respected independent expert in surface topography measurement at the UK government-funded National Physical Laboratory. He has edited this book from the contributions of the experts and manufacturers for each optical measurement technique.
As an expert in the field I would recommend this book.
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