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Optical Measurement of Surface Topography [Hardcover]

Richard Leach
5.0 out of 5 stars  See all reviews (4 customer reviews)
RRP: 135.00
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Book Description

5 April 2011 3642120113 978-3642120114 2011

The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manu­facturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.


Product details

  • Hardcover: 340 pages
  • Publisher: Springer; 2011 edition (5 April 2011)
  • Language: English
  • ISBN-10: 3642120113
  • ISBN-13: 978-3642120114
  • Product Dimensions: 2 x 16 x 23.5 cm
  • Average Customer Review: 5.0 out of 5 stars  See all reviews (4 customer reviews)
  • Amazon Bestsellers Rank: 1,856,371 in Books (See Top 100 in Books)
  • See Complete Table of Contents

More About the Author

Richard obtained a BSc in Applied Physics with Microelectronics and Computing from Kinston University in 1989, an MSc in Industrial Measurement Systems from Brunel University in 1994 and PhD in Surface Metrology from University of Warwick in 2000. His PhD thesis topic was the development of the World's first inherently traceable method for surface profile measurement. He has been with NPL since 1990 and has worked in the areas of surface metrology, end standard measurement, co-ordinate metrology and nanometrology.

Richard is on the Council of the European Society of Precision Engineering and Nanotechnology, the Board of Directors of the American Society of Precision Engineering, the Institute of Nanotechnology Advisory Board, the EPSRC Peer Review College, the International Committee on Measurements and Instrumentation and several international standards committees. He is the European Editor-in-Chief for Precision Engineering and the founder of the new Institute of Physics journal: Surface Topography: Metrology & Properties. He has over 200 publications including three textbooks. Richard is a Fellow of the Institute of Physics, the Institution of Engineering & Technology, the Institute of Nanotechnology, the Royal Society for the encouragement of Arts, Manufactures and Commerce and a Sustained Member of the American Society of Precision Engineers and a Chartered Physicist.

Richard is currently a Principal Research Scientist at the National Physical Laboratory in the UK and a visiting professor at Loughborough University and the Harbin Institute of Technology. He leads the research of the Dimensional Nanometrology Team within the Engineering Measurement Division (www.npl.co.uk/nanometrology).

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Review

From the reviews:

“This book shows how optical microscopy can be used in the characterization and metrology of various surfaces. … Several important methods are presented in a clear and simple way … . The case studies scattered throughout the text greatly improve the readability and contribute to the practical emphasis of this book. … the index is comprehensive. I recommend this book to anyone trying to find the most appropriate method for surface topography measurement, as well as researchers who are new to using microscopy for measurements.”­­­ (Dejan Pantelić, Optics & Photonics News, December, 2011)

From the Back Cover

The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manu­facturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.


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Most Helpful Customer Reviews
3 of 3 people found the following review helpful
5.0 out of 5 stars Leading edge techniques 14 May 2011
Format:Hardcover
This edited collection is a very clear and systematic overview of techniques in a field of growing importance in engineering, technology and manufacturing. Professor Leach of the National Physical Laboratory (UK) has succeeded in bringing together some of the leading experts to cover topics such as Optical 3D Sensors, Chromatic Confocal Microscopy, Phase Shifting Interferometry, Digital Holographic Microscopy and Light Scattering Methods. The researcher and student will find the book to be state-of-the-art and facilitated by its ample use of graphic material including many useful colour images and extensive reference lists. Those who work in many fields - as diverse as fluidics, optics, tribology and aerodynamics - will want to have a copy on their shelf or in their library. Highly recommended.
Prof. G. Hunt, St Mary's University College, London.
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1 of 1 people found the following review helpful
5.0 out of 5 stars Excellent comprehensive book 14 May 2012
Format:Hardcover
Richard Leach who is an internationally recognised expert in surface topography has put together the contributions from many leading experts in the field to make this book an excellent comprehensive overview of all the optical measurement techniques. From my own experience I know that producing such a work requires not only thorough knowledge but also dedication and endurance. These techniques have become extremely important to designers and manufacturers of precison components and end-products at the micro-nanoscale where non-invasive measurements are essential. The book is well-structured and balanced to appeal to students, researchers and practitioners. The graphical material and extensive list of references are particularly useful. I recommend the book to all who wish to have a detailed knowledge of the fundamentals of optical measurement surface topography and the current techniques available.
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1 of 1 people found the following review helpful
5.0 out of 5 stars A practical overview from those who know 17 April 2012
Format:Hardcover
Measurement of surface topography on the micro- to nanoscale with optical measurement techniques is essential to support all the technological advantages we take for granted: consumer electronics; bioengineering; energy; transport; defence and more.

This book contains a good balance of the relevant fundamentals and a thorough but practical description of the key optical techniques. It is ideally suited to teach a student or professional the power and limitations of the techniques.

Professor Leach is an internationally-respected independent expert in surface topography measurement at the UK government-funded National Physical Laboratory. He has edited this book from the contributions of the experts and manufacturers for each optical measurement technique.

As an expert in the field I would recommend this book.
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5.0 out of 5 stars A very good book 14 Jun 2013
By Adam
Format:Hardcover
Short version: a very good, comprehensive book that will get the Reader up to speed.

Longer version:
I recently started working on a research project in the area of surface metrology. Being an electronics engineer, my knowledge of the field was limited and consequently someone recommended that I read this book.

As highlighted in other reviews, this book contains chapters on most state-of-the-art optical techniques that are currently applied to surface metrology. Each chapter was written by an expert (i.e. leading company CEO, leading researcher in the field or Mr "I invented most of this technique") and covers the principles of operation, applications and limitations of the respective technique. Each chapter also ends in an invaluable repository of links to the knowledge - the references.

Overall, this book and the references that I had found in it helped me to get an in-depth knowledge for my specific application.

On the down side, there are minor inconsistencies in writing styles between chapters but this is typical for edited books and does not affect the overall quality of this book - it's not a novel after all.
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Most Helpful Customer Reviews on Amazon.com (beta)
Amazon.com: 5.0 out of 5 stars  1 review
5.0 out of 5 stars Excellent technical reference book 15 Sep 2011
By Dirk Schoellner - Published on Amazon.com
Format:Hardcover
This collection of technical articles is a very well written, well organized explanation of the wide range of non-contact techniques available for surface metrology measurements. Edited by Richard Leach, a top metrologist at the National Physical Laboratory in the UK, this book begins with an introduction to optical surface measurements that includes clear and concise definitions of the relevant technical terms. Importantly, the book clearly explains both profile and areal techniques, and is aimed towards the new ISO 25178 areal measurement standard. The remainder of the book consists of articles dedicated to each non-contact technique, written by an expert in the field. Equipment covered includes, but is not limited to, confocal microscopy, interferometry, focus variation, and scattering methods. Finally, chapters 3 & 4 address the inherent limitations of optical metrology and address the critical topic of correct calibration of an optical measurement system. This book holds an important place as a reference standard for anyone serious about non-contact surface metrology.
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