Interferogram Analysis: Digital Fringe Pattern Measurement Techniques [Hardcover]

David W. Robinson (Editor), Graeme T. Reid (Editor)

5.0 out of 5 stars See all reviews (1 customer review)

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Product details

Hardcover: 268 pages
Publisher: Institute of Physics Publishing; illustrated edition edition (12 Nov 2002)
Language English
ISBN-10: 075030197X
ISBN-13: 978-0750301978
Product Dimensions: 24.8 x 17.1 x 2.5 cm

Average Customer Review: 5.0 out of 5 stars See all reviews (1 customer review)

Amazon Bestsellers Rank: 4,150,667 in Books (See Top 100 in Books)
- #72 in Books > Scientific, Technical & Medical > Engineering > Mechanical & Material Engineering > Thermodynamics

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Product Description

In preparing this book, the aim has been to draw together a field of work which has developed over the last 10 years into a subject in its own right. Techniques for analysis of fringe patterns have advanced from often laborious manual reduction by a specialist technician to the point where fully automatic computer analysis is possible, using commercial software packages to assist the non-specialist in any particular measurement application. This book describes the currently applicable techniques for automatic fringe pattern reduction. These are described together with many of the application areas (principally in the applied optics field) thus providing, in a tutorial format, the basis of further study by postgraduate students or applications engineers needing a range of potential solutions to a measurement or data reduction problem. The book will be of particular value to academic postgraduates, government and industrial researchers in the fields of mechanical engineering, metrology and non-destructive testing, and those interested in the applications of interferometry in medicine, civil engineering, offshore engineering, aeronautical engineering and electrical engineering. In addition, the book should be a valuable reference work for physicists, computer scientists and mathematicians with interests in interferometry. It consists of a sequence of chapters containing reviews of the main techniques for digital interferogram analysis by leading experts from around the world. These, together with the introductory chapters on computer image processing and optical measurement techniques, make the book a self-contained guide to the subject.

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1 of 1 people found the following review helpful:

5.0 out of 5 stars excellent book for research purposes, 14 Jan 2003

Munther Gdeisat (Hatfield, Hertfordshire United Kingdom) - See all my reviews

This review is from: Interferogram Analysis: Digital Fringe Pattern Measurement Techniques (Hardcover)

This book is very good for research purposes. I have worked with fringe patterns (interfergrams) demodulation for five years as a researcher in Liverpool John Moores University. During this work I found this book very useful.

This book starts with a background in image processing. Then it explains fringe pattern analysis using temporal and spatial fringe analysis methods. The book continues in explaining the application of fringe analysis. The book concludes in explaining the unwrapping problem.

The book consists of eight chapters. Each chapter is written by a world known researcher in that field. I always recommend this book to my research students.

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