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Fundamentals of Powder Diffraction and Structural Characterization of Materials [Paperback]

Vitalij Pecharsky (Author), Peter Zavalij (Author)

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Product details

Paperback: 713 pages
Publisher: Springer; 1st ed. 2003. 2nd printing edition (13 April 2005)
Language English
ISBN-10: 0387241477
ISBN-13: 978-0387241470
Product Dimensions: 23.4 x 15.5 x 3.8 cm
Amazon Bestsellers Rank: 2,214,879 in Books (See Top 100 in Books)

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Product Description

Fundamentals of Powder Diffraction and Structural Characterization of Materials provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters one though three give essential theoretical background, while chapters four through seven guide the reader through practical aspects of extracting structural information from powder data. The book is supplemented by a compact disk containing experimental data collected from a variety of materials that are used as examples and in the problems offered at the end of every chapter. In addition color electronic versions of some 300 illustrations found throughout the book will be included.

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1 of 2 people found the following review helpful

User friendly, great book! 22 Nov 2008

By Moose Moose - Published on Amazon.com

Format:Kindle Edition

This book is one of the few books that doesn't assume prior knowledge but it doesn't dumb down the subject either. It really does what other science texts claim to do - it is useful for the beginner and the expert.

Nothing is more frustrating than wading through information you already know; except reading a book that assumes you have everything in place in the way of training and expereince to understand what they are talking about. My questions always seem need more or less than what most books offer. This book is spot on.

The first half is about the theory and practical guidelines for collecting x-ray diffraction data on powders. The last half carefully develops the understanding needed to refine the data with the Rietveld method.

This book is a highly useful reference to me. I am a researcher who had a few years of experience using Rietveld in graduate school. Back then (7 years ago)I had very good help from my advisor, procedures to follow and relativly simple problems to tackle. Recently, I had the opportunity to bring quantitative phase analsis to my current work place. This was terribly difficult as first - this book was highly recommended to me and I have found it very valuable.

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