Product Description
This book deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide and incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition should be an essential textbook. Key Features: * Already established as an essential book in the field around the world * Each chapter contains questions and answers for students * A vital introductory text for materials scientists * The text is liberally illustrated * Provides a readable guide to scanning and transmission microscopes
About the Author
Peter J. Goodhew is a materials scientist who has worked with Electron Microscopes for 35 years at the University of Surrey, Cornell University and The University of Liverpool. He has written more than 200 papers on the applications of Electron Microscopes in metallurgy and semiconductor science. He is currently the Henry Bell Wortley, Professor of Materials Engineering at The University of Liverpool
