These are the most frequently used words in another edition of this book.
although
analysis
angle
aperture
area
atomic
atoms
backscattered
beam
between
case
chapter
conditions
contrast
crystal
current
dark
depth
detector
diameter
different
diffraction
distance
effect
electron
elements
energy
equation
example
few
field
figure
first
give
high
however
image
imaging
information
intensity
ion
large
lattice
lens
lenses
light
line
magnification
material
may
mean
microscope
microscopy
must
nm
number
objective
obtained
order
pattern
peak
planes
point
possible
probe
ray
region
resolution
sample
scanning
scattering
secondary
section
see
seen
sem
shown
shows
signal
since
size
small
specimen
spectrometer
spot
surface
system
technique
tem
therefore
thickness
thin
thus
time
two
type
use
used
usually
wavelength