or
Sign in to turn on 1-Click ordering.
Trade in Yours
For a 34.64 Gift Card
Trade in
More Buying Choices
Have one to sell? Sell yours here
Sorry, this item is not available in
Image not available for
Colour:
Image not available

 
Tell the Publisher!
Id like to read this book on Kindle

Don't have a Kindle? Get your Kindle here, or download a FREE Kindle Reading App.

Characterisation of Radiation Damage by Transmission Electron Microscopy (Series in Microscopy in Materials Science) [Hardcover]

M.L Jenkins , M.A Kirk

RRP: 141.00
Price: 129.48 & FREE Delivery in the UK. Details
You Save: 11.52 (8%)
o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o o
Only 1 left in stock (more on the way).
Dispatched from and sold by Amazon. Gift-wrap available.
Want it tomorrow, 26 July? Choose Express delivery at checkout. Details
Trade In this Item for up to 34.64
Trade in Characterisation of Radiation Damage by Transmission Electron Microscopy (Series in Microscopy in Materials Science) for an Amazon Gift Card of up to 34.64, which you can then spend on millions of items across the site. Trade-in values may vary (terms apply). Learn more

Book Description

21 Nov 2000 075030748X 978-0750307482
Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials.

Product details


More About the Author

Discover books, learn about writers, and more.

Inside This Book (Learn More)
First Sentence
Transmission electron microscopy (TEM) is probably the most important and widely used method of characterization in materials science. Read the first page
Explore More
Concordance
Browse Sample Pages
Front Cover | Copyright | Table of Contents | Excerpt | Index | Back Cover
Search inside this book:

Sell a Digital Version of This Book in the Kindle Store

If you are a publisher or author and hold the digital rights to a book, you can sell a digital version of it in our Kindle Store. Learn more

Customer Reviews

There are no customer reviews yet.
5 star
4 star
3 star
2 star
1 star

Customer Discussions

This product's forum
Discussion Replies Latest Post
No discussions yet

Ask questions, Share opinions, Gain insight
Start a new discussion
Topic:
First post:
Prompts for sign-in
 

Search Customer Discussions
Search all Amazon discussions
   


Look for similar items by category


Feedback