- Hardcover: 368 pages
- Publisher: Wiley-Blackwell (2 Dec 1987)
- Language English
- ISBN-10: 0471624632
- ISBN-13: 978-0471624639
- Product Dimensions: 24.3 x 16.2 x 2.2 cm
- Average Customer Review: 5.0 out of 5 stars See all reviews (1 customer review)
- Amazon Bestsellers Rank: 5,454,904 in Books (See Top 100 in Books)
- See Complete Table of Contents
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Product Description
Product Description
This handbook provides ready access to all of the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. The main intention of this book is to present the material in a unified manner, making it a useful source for practising professionals and students alike. It opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, reviewing by comparison the principles of design for testability of more advanced digital technology. It then offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing; and various data compression methods, such as polynomial dividers and unique shift-register sequence generators with special applications. Also detailed are random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing. The last section describes the kinds of test support systems necessary for a successful built-in test.
Inside This Book
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First Sentence
Testing of digital circuits is a major portion of the effort in their design, production, and use. Read the first page
Front Cover | Copyright | Table of Contents | Excerpt | Index | Back Cover
Testing of digital circuits is a major portion of the effort in their design, production, and use. Read the first page
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Concordance
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Front Cover | Copyright | Table of Contents | Excerpt | Index | Back Cover
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Customer Reviews
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Most Helpful Customer Reviews
5.0 out of 5 stars
BEST TEST BOOK,
By A Customer
This review is from: Built-in Test for Very Large Scale Integration: Pseudorandom Techniques (Hardcover)
This is the best test book I have read. It covers all aspects of
BIST with emphasis on pseudorandom techniques. It does not cover as
much about testing as "Digital System Testing and Testable Design" but
it is well worth its price tag.
Share your thoughts with other customers: Create your own review
Most Helpful Customer Reviews on Amazon.com (beta) Amazon.com:
4.5 out of 5 stars (2 customer reviews) 1 of 1 people found the following review helpful:
5.0 out of 5 stars
BEST TEST BOOK,
By A Customer - Published on Amazon.com
This review is from: Built-in Test for Very Large Scale Integration: Pseudorandom Techniques (Hardcover)
This is the best test book I have read. It covers all aspects of
BIST with emphasis on pseudorandom techniques. It does not cover as
much about testing as "Digital System Testing and Testable Design" but
it is well worth its price tag.
4.0 out of 5 stars
Great Digital test book,
By Enrique Saro-nunez "kikito_1987" - Published on Amazon.com
This review is from: Built-in Test for Very Large Scale Integration: Pseudorandom Techniques (Hardcover)
This is a great book written from professionals in the materia. I personally took the class with Dr. Savir and he is not only a great professor but this book is well worth purchasing.
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